SEM/EDS LAB

SCANNING ELECTRON MICROSCOPY (SEM) AND ENERGY DISPERSIVE X-RAY SPECTROSCOPY (EDS).

Scanning Electron Microscopy (SEM) and Energy Dispersive X-Ray Spectroscopy (EDS) with full digital imaging has emerged as an essential tool in metallurgical testing and failure analysis. Using a beam of highly energetic electrons, SEM allows us to acquire live, high-resolution, micro scale, three-dimensional images of the surface of a failed metal part or component. Using these digital images with a magnification of up to 500,000x, we are able to study the fracture topography and morphological characteristics of the failed metal part or component to determine the failure mode and root cause. Scanning electron microscopy with EDS is also used for determining the chemical composition of constituents in the microstructure, determining plating types, finding and chemically analyzing contamination, and more.

At QAI we have two full SEM/EDS systems. One of these systems features cutting-edge technology in the field of microscopy giving us an advantage with clear imaging and EDS mapping capabilities. The other SEM was upgraded with new software and controls. One of our SEM’s is capable of variable pressure allowing us to perform analysis on plastics and all non-conductive materials.

QAI’S SEM CAPABILITIES INCLUDE:

EDAX FULL ENERGY DISPERSIVE X-RAY SPECTROSCOPY CAPABILITIES:

• Qualitative analysis
• Quantitative analysis
• Elemental Mapping and Scanning
• Fast and Accurate plots of elemental distributions
• Powerful automated particle analysis
• Automated spectrum collection

EVALUATING FAILURE MODE WITH SEM